Maintenance Testing for the Data Encryption Standard

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Author

Jason Gait

Entry type

techreport

Abstract

This publication describes the design of four maintenance tests for the Federal Information Processing Data Encryption Standard (DES). The tests consist of an iterative procedure that tests the operation of DES devices by using a small program and minimum data. The tests are designed to be independent of implementation and to be fast enough to test devices during actual operation. The tests are defined as four specific stopping points in a general testing process and satisfy four testing requirements of increasing degree of completeness depending on the throughness of testing desired.

Key alpha

Gait

Affiliation

U.S. Department of Commerce

Publication Date

0000-00-00

1. Introduction....1 1.1 Validation vs. Maintenance Testing....2 1.2 The Maintenance Tests....3 1.3 The Values for the Parameters of the Test....6 2. Description of the DES Algorithm....6 2.1 The Permutations and E Operator....7 2.2 The S-boxes....7 2.3 The Key Schedule...8 2.4 Maintaining the Corectness of DES Devices...8 2.4.1 DES Tests 2.4.2 Relationship to Validation Tests...9 3. Testing Philosophy...9 3.1 Stuck-Faults in Cipher Feedback Mode...9 3.2 Generating the Pseudo-random Tests...10 3.3 Description of Tests 4. Summary and Conclusions...12 5. Appendix A: The DES ALgorithm SPecification...14 6. Appendix B: The Gram-Schmidt Algorithm...19 7. Appendix C: Pseudo-random Testing of Linear Devices...21

Keywords

Communications sceurity, computer security, cryptography, data encryption standard, in-service testing, maintenance tests, Monte-Carlo testing, stuck-fault testing, test cases

Language

English

Location

A hard-copy of this is in Haas

Subject

Communications security

BibTex-formatted data

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@Techreport{ Gait,
	title = "Maintenance Testing for the Data Encryption Standard",
	author = "Jason Gait",
	abstract = "This publication describes the design of four maintenance tests for the Federal Information Processing Data  Encryption Standard (DES).  The tests consist of an iterative procedure that tests the operation of DES devices by using a small program and minimum data.  The tests are designed to be independent of implementation and to be fast enough to test devices during actual operation.  The tests are defined as four specific stopping points in a general testing process and satisfy four testing requirements of increasing degree of completeness depending on the throughness of testing desired.",
	affiliation = "U.S. Department of Commerce",
	contents = "1. Introduction....1
 1.1 Validation vs. Maintenance            Testing....2
 1.2 The Maintenance Tests....3
 1.3 The Values for the Parameters of the Test....6

2.  Description of the DES Algorithm....6
 2.1 The Permutations and E Operator....7
 2.2 The S-boxes....7
 2.3 The Key Schedule...8
 2.4 Maintaining the Corectness of DES Devices...8
    2.4.1 DES Tests
    2.4.2 Relationship to Validation Tests...9

3. Testing Philosophy...9
 3.1 Stuck-Faults in Cipher Feedback Mode...9
 3.2 Generating the Pseudo-random Tests...10
 3.3 Description of Tests

4. Summary and Conclusions...12
5. Appendix A: The DES ALgorithm SPecification...14
6. Appendix B: The Gram-Schmidt Algorithm...19
7.  Appendix C: Pseudo-random Testing of Linear Devices...21",
	keywords = "Communications sceurity, computer security, cryptography, data encryption standard, in-service testing, maintenance tests, Monte-Carlo testing, stuck-fault testing, test cases",
	language = "English",
	subject = "Communications security",
}